Weymouth, A. J. and Giessibl, F. J. (2012) The effect of sample resistivity on Kelvin probe force microscopy. APPLIED PHYSICS LETTERS, 101 (21): 213105. ISSN 0003-6951,
Full text not available from this repository.Abstract
Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption often made is that the applied bias drops fully in the tip-sample junction. We have recently identified an effect, the Phantom force, which can be explained by an ohmic voltage drop near the tip-sample junction causing a reduction of the electrostatic attraction when a tunneling current is present. Here, we demonstrate the strong effect of the Phantom force upon KPFM that can even produce Kelvin parabolae of opposite curvature. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4766185]
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | ; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 04 May 2020 07:02 |
| Last Modified: | 04 May 2020 07:02 |
| URI: | https://pred.uni-regensburg.de/id/eprint/17782 |
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