Robust absolute magnetometry with organic thin-film devices

Baker, W. J. and Ambal, K. and Waters, D. P. and Baarda, R. and Morishita, H. and van Schooten, K. and McCamey, D. R. and Lupton, J. M. and Boehme, C. (2012) Robust absolute magnetometry with organic thin-film devices. NATURE COMMUNICATIONS, 3: 898. ISSN 2041-1723,

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Abstract

Magnetic field sensors based on organic thin-film materials have attracted considerable interest in recent years as they can be manufactured at very low cost and on flexible substrates. However, the technological relevance of such magnetoresistive sensors is limited owing to their narrow magnetic field ranges (similar to 30 mT) and the continuous calibration required to compensate temperature fluctuations and material degradation. Conversely, magnetic resonance (MR)-based sensors, which utilize fundamental physical relationships for extremely precise measurements of fields, are usually large and expensive. Here we demonstrate an organic magnetic resonance-based magnetometer, employing spin-dependent electronic transitions in an organic diode, which combines the low-cost thin-film fabrication and integration properties of organic electronics with the precision of a MR-based sensor. We show that the device never requires calibration, operates over large temperature and magnetic field ranges, is robust against materials degradation and allows for absolute sensitivities of <50 nT Hz(-1/2).

Item Type: Article
Uncontrolled Keywords: PI-CONJUGATED POLYMERS; LIGHT-EMITTING-DIODES; POLARON PAIRS; SPIN; SEMICONDUCTORS; DIAMOND;
Subjects: 500 Science > 530 Physics
Divisions: Physics > Institute of Experimental and Applied Physics > Chair Professor Lupton > Group John Lupton
Depositing User: Dr. Gernot Deinzer
Date Deposited: 12 May 2020 09:37
Last Modified: 12 May 2020 09:37
URI: https://pred.uni-regensburg.de/id/eprint/18622

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