Meyer, Gerhard and Gross, Leo and Mahn, Fabian and Repp, Jascha (2012) Scanning Probe Microscopy of Atoms and Molecules on Insulating Films: From Imaging to Molecular Manipulation. CHIMIA, 66 (1-2). pp. 10-15. ISSN 0009-4293,
Full text not available from this repository. (Request a copy)Abstract
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) of single atoms and molecules on ultrathin insulating films have led to a wealth of novel observations and insights. Based on the reduced electronic coupling to the metallic substrate, these techniques allow the charge state of individual atoms to be controlled, orbitals of individual molecules to be imaged and metal-molecule complexes to be built up. Near-contact AFM adds the unique capabilities of imaging and probing the chemical structure of single molecules with atomic resolution. With the help of atomic/molecular manipulation techniques, chemical binding processes and molecular switches can be studied in detail.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | FORCE MICROSCOPY; TUNNELING MICROSCOPE; CHARGE-STATE; SINGLE ATOMS; RESOLUTION; SURFACE; SPECTROSCOPY; ELECTRONICS; CHEMISTRY; TIP; Atomic force microscopy; Insulating film; Molecular electronics; Scanning tunneling microscopy; Single molecule |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Jascha Repp |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 25 May 2020 12:18 |
| Last Modified: | 25 May 2020 12:19 |
| URI: | https://pred.uni-regensburg.de/id/eprint/19526 |
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