Wurstbauer, Ulrich and Roeling, Christian and Wurstbauer, Ursula and Wegscheider, Werner and Vaupel, Matthias and Thiesen, Peter H. and Weiss, Dieter (2010) Imaging ellipsometry of graphene. APPLIED PHYSICS LETTERS, 97 (23): 231901. ISSN 0003-6951,
Full text not available from this repository. (Request a copy)Abstract
Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene's optical properties can be investigated. (C) 2010 American Institute of Physics. [doi:10.1063/1.3524226]
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | FILMS; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 06 Jul 2020 08:11 |
| Last Modified: | 06 Jul 2020 08:11 |
| URI: | https://pred.uni-regensburg.de/id/eprint/23748 |
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