Gretz, Oliver and Weymouth, Alfred J. and Holzmann, Thomas and Pürckhauer, Korbinian and Giessibl, Franz J. (2021) Determining amplitude and tilt of a lateral force microscopy sensor. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 12. pp. 517-524. ISSN 2190-4286
Full text not available from this repository. (Request a copy)Abstract
In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on the acquired data. To determine the amplitude and tilt we make use of the scanning tunneling microscopy (STM) channel and acquire data without and with oscillation of the tip above a local surface feature. We use a full two-dimensional current map of the STM data without oscillation to simulate data for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | frequency-modulation atomic force microscopy; lateral force microscopy; amplitude calibration; tilt estimation |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 05 Jul 2022 10:43 |
| Last Modified: | 05 Jul 2022 10:43 |
| URI: | https://pred.uni-regensburg.de/id/eprint/46086 |
Actions (login required)
 |
View Item |
