Items where Author is "Altmann, Hans"

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Olbrich, Alexander and Ebersberger, Bernd and Boit, Christian and Vancea, Johann and Hoffmann, Horst and Altmann, Hans and Gieres, Guenther and Wecker, Joachim (2001) Oxide thickness mapping of ultrathin Al2O3 at nanometer scale with conducting atomic force microscopy. APPLIED PHYSICS LETTERS, 78 (19). pp. 2934-2936. ISSN 0003-6951

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