Items where Author is "Attenberger, W."

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Brunner, W. and Attenberger, W. and Hoffmann, H. and Zweck, Josef (2001) Derivation of pair distribution functions for interface interdiffusion analysis for multilayered thin films using high-energy electron diffraction. JOURNAL OF PHYSICS-CONDENSED MATTER, 13 (13). pp. 2865-2873. ISSN 0953-8984

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