Items where Author is "Hagenhoff, Birgit"

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Troeger, Jan and Kersting, Reinhard and Hagenhoff, Birgit and Bougeard, Dominique and Abrosimov, Nikolay V. and Klos, Jan and Schreiber, Lars R. and Bracht, Hartmut (2025) Optimizing time-of-flight secondary ion mass spectrometry depth profiles of semiconductor heterostructures. JOURNAL OF APPLIED PHYSICS, 137 (2): 025301. ISSN 0021-8979, 1089-7550

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