Items where Author is "Pielmeier, Florian"

Article

Pielmeier, Florian and Landolt, Gabriel and Slomski, Bartosz and Muff, Stefan and Berwanger, Julian and Eich, Andreas and Khajetoorians, Alexander A. and , Jens and Aliev, Ziya S. and Babanly, Mahammad B. and Wiesendanger, Roland and Osterwalder, Juerg and Chulkov, Evgueni V. and Giessibl, Franz J. and Dil, J. Hugo (2015) Response of the topological surface state to surface disorder in TlBiSe2. NEW JOURNAL OF PHYSICS, 17: 023067. ISSN 1367-2630

Emmrich, Matthias and Huber, Ferdinand and Pielmeier, Florian and Welker, Joachim and Hofmann, Thomas and Schneiderbauer, Maximilian and Meuer, Daniel and Polesya, Svitlana and Mankovsky, Sergiy and Koedderitzsch, Diemo and Ebert, Hubert and Giessibl, Franz J. (2015) Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters. SCIENCE, 348 (6232). pp. 308-311. ISSN 0036-8075, 1095-9203

Hofmann, Thomas and Pielmeier, Florian and Giessibl, Franz J. (2014) Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy. PHYSICAL REVIEW LETTERS, 112 (6): 066101. ISSN 0031-9007, 1079-7114

Pielmeier, Florian and Meuer, Daniel and Schmid, Daniel and Strunk, Christoph and Giessibl, Franz J. (2014) Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 5. pp. 407-412. ISSN 2190-4286

Pielmeier, Florian and Giessibl, Franz J. (2013) Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy. PHYSICAL REVIEW LETTERS, 110 (26): UNSP 26610. ISSN 0031-9007

Giessibl, Franz J. and Pielmeier, Florian and Eguchi, Toyoaki and An, Toshu and Hasegawa, Yukio (2011) Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. PHYSICAL REVIEW B, 84 (12): 125409. ISSN 1098-0121