Items where Author is "Qiu, Jinglan"

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Kirpal, Dominik and Qiu, Jinglan and Puerckhauer, Korbinian and Weymouth, Alfred J. and Metz, Michael and Giessibl, Franz J. (2021) Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes. REVIEW OF SCIENTIFIC INSTRUMENTS, 92 (4): 043703. ISSN 0034-6748, 1089-7623

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