Items where Author is "Schärpf, O."
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Salditt, T. and Lott, D. and Metzger, T. H. and Peisl, J. and Fischer, R. and Zweck, Josef and Hoghoj, P. and Schärpf, O. and Vignaud, G. (1996) Observation of the Huygens-principle growth mechanism in sputtered W/Si multilayers. EUROPHYSICS LETTERS, 36 (8). pp. 565-570. ISSN 0295-5075
