Neu, M. and Moll, N. and Gross, L. and Meyer, G. and Giessibl, F. J. and Repp, J. (2014) Image correction for atomic force microscopy images with functionalized tips. PHYSICAL REVIEW B, 89 (20): 205407. ISSN 1098-0121, 1550-235X
Full text not available from this repository.Abstract
It has been demonstrated that atomic force microscopy imaging with CO-functionalizedtips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the tip apex is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | SINGLE-MOLECULE; REAL-SPACE; RESOLUTION; IDENTIFICATION; SPECTROSCOPY; GRAPHENE; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Jascha Repp |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 08 Nov 2019 14:46 |
| Last Modified: | 08 Nov 2019 14:46 |
| URI: | https://pred.uni-regensburg.de/id/eprint/10191 |
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