Schneiderbauer, Maximilian and Emmrich, Matthias and Weymouth, Alfred J. and Giessibl, Franz J. (2014) CO Tip Functionalization Inverts Atomic Force Microscopy Contrast via Short-Range Electrostatic Forces. PHYSICAL REVIEW LETTERS, 112 (16): 166102. ISSN 0031-9007, 1079-7114
Full text not available from this repository. (Request a copy)Abstract
We investigate insulating Cu2N islands grown on Cu(100) by means of combined scanning tunneling microscopy and atomic force microscopy with two vastly different tips: a bare metal tip and a CO-terminated tip. We use scanning tunneling microscopy data as proposed by Choi, Ruggiero, and Gupta to unambiguously identify atomic positions. Atomic force microscopy images taken with the two different tips show an inverted contrast over Cu2N. The observed force contrast can be explained with an electrostatic model, where the two tips have dipole moments of opposite directions. This highlights the importance of short-range electrostatic forces in the formation of atomic contrast on polar surfaces in noncontact atomic force microscopy.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | CHARGE-STATE; SURFACES; MOLECULES; ANISOTROPY; RESOLUTION; ENERGY; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 13 Nov 2019 15:23 |
| Last Modified: | 13 Nov 2019 15:23 |
| URI: | https://pred.uni-regensburg.de/id/eprint/10295 |
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