Pielmeier, Florian and Meuer, Daniel and Schmid, Daniel and Strunk, Christoph and Giessibl, Franz J. (2014) Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 5. pp. 407-412. ISSN 2190-4286,
Full text not available from this repository. (Request a copy)Abstract
In frequency modulation atomic force microscopy (FM-AFM) the stability of the eigenfrequency of the force sensor is of key importance for highest precision force measurements. Here, we study the influence of temperature changes on the resonance frequency of force sensors made of quartz, in a temperature range from 4.8-48 K. The sensors are based on the qPlus and length extensional principle. The frequency variation with temperature T for all sensors is negative up to 30 K and on the order of 1 ppm/K, up to 13 K, where a distinct kink appears, it is linear. Furthermore, we characterize a new type of miniaturized qPlus sensor and confirm the theoretically predicted reduction in detector noise.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | VELOCITY-MEASUREMENTS; ATOMIC-RESOLUTION; IRRADIATED QUARTZ; TUNING FORK; EXPANSION; OPERATION; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Christoph Strunk |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 14 Nov 2019 10:34 |
| Last Modified: | 14 Nov 2019 10:34 |
| URI: | https://pred.uni-regensburg.de/id/eprint/10323 |
Actions (login required)
 |
View Item |
