Wastl, Daniel S. (2017) Ambient atomic resolution atomic force microscopy with qPlus sensors: Part 1. WILEY, HOBOKEN.
Full text not available from this repository. (Request a copy)Abstract
Atomic force microscopy (AFM) is an enormous tool to observe nature in highest resolution and understand fundamental processes like friction and tribology on the nanoscale. Atomic resolution in highest quality was possible only in well-controlled environments like ultrahigh vacuum (UHV) or controlled buffer environments (liquid conditions) and more specified for long-term high-resolution analysis at low temperatures (similar to 4 K) in UHV where drift is nearly completely absent. Atomic resolution in these environments is possible and is widely used. However, in uncontrolled environments like air, with all its pollutants and aerosols, unspecified thin liquid films as thin as a single molecular water-layer of 200 pm or thicker condensation films with thicknesses up to hundred nanometer, have been a problem for highest resolution since the invention of the AFM. The goal of true atomic resolution on hydrophilic as well as hydrophobic samples was reached recently. In this manuscript we want to review the concept of ambient AFM with atomic resolution. The reader will be introduced to the phenomenology in ambient conditions and the problems will be explained and analyzed while a method for scan parameter optimization will be explained. Recently developed concepts and techniques how to reach atomic resolution in air and ultra-thin liquid films will be shown and explained in detail, using several examples.
| Item Type: | Other |
|---|---|
| Uncontrolled Keywords: | SCANNING-TUNNELING-MICROSCOPY; CALCITE-WATER INTERFACE; MOLECULAR-DYNAMICS SIMULATIONS; RESIN-BASED COMPOSITES; X-RAY REFLECTIVITY; HYDRATION FORCES; 10(1)OVER-BAR4 CALCITE; NACL(100) SURFACE; BIOFILM FORMATION; ADSORPTION; air; atomic resolution; ambient conditions; atomic force microscope; hydration layer |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 14 Dec 2018 12:58 |
| Last Modified: | 12 Feb 2019 09:50 |
| URI: | https://pred.uni-regensburg.de/id/eprint/139 |
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