Oberhuber, Florian and Blien, Stefan and Heydrich, Stefanie and Yaghobian, Fatemeh and Korn, Tobias and Schueller, Christian and Strunk, Christoph and Weiss, Dieter and Eroms, Jonathan (2013) Weak localization and Raman study of anisotropically etched graphene antidots. APPLIED PHYSICS LETTERS, 103 (14): 143111. ISSN 0003-6951, 1077-3118
Full text not available from this repository. (Request a copy)Abstract
We study a crystallographic etching process of graphene nanostructures, where zigzag edges can be prepared selectively. The process involves heating exfoliated single-layer graphene samples with a predefined pattern of antidot arrays in an argon atmosphere at 820 degrees C, which selectively removes carbon atoms located on armchair sites. Atomic force microscopy and scanning electron microscopy cannot resolve the structure on the atomic scale. However, weak localization and Raman measurements, which both probe intervalley scattering at armchair edges, indicate that zigzag regions are enhanced compared to samples prepared with oxygen based reactive ion etching only. (C) 2013 AIP Publishing LLC.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | HYDROGEN-PLASMA; LAYER GRAPHENE; ZIGZAG EDGES; NANORIBBONS; SPECTROSCOPY; SCATTERING; DISORDER; STATE; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Lupton > Group Christian Schüller Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Christoph Strunk |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 31 Mar 2020 11:32 |
| Last Modified: | 31 Mar 2020 11:32 |
| URI: | https://pred.uni-regensburg.de/id/eprint/16011 |
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