Tikhonov, E. S. and Khrapai, V. S. and Shovkun, D. V. and Schuh, D. (2013) Finite-size effect in shot noise in hopping conduction. JETP LETTERS, 98 (2). pp. 121-126. ISSN 0021-3640, 1090-6487
Full text not available from this repository. (Request a copy)Abstract
We study a current shot noise in a macroscopic insulator based on a two-dimensional electron system in GaAs in a variable range hopping (VRH) regime. At low temperature and in a sufficiently depleted sample a shot noise close to a full Poissonian value is measured. This suggests an observation of a finite-size effect in shot noise in the VRH conduction and demonstrates a possibility of accurate quasiparticle charge measurements in the insulating regime.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | TRANSPORT; CHARGE; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 01 Apr 2020 06:37 |
| Last Modified: | 01 Apr 2020 06:37 |
| URI: | https://pred.uni-regensburg.de/id/eprint/16114 |
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