Welker, Joachim and Weymouth, Alfred John and Giessibl, Franz J. (2013) The Influence of Chemical Bonding Configuration on Atomic Identification by Force Spectroscopy. ACS NANO, 7 (8). pp. 7377-7382. ISSN 1936-0851,
Full text not available from this repository. (Request a copy)Abstract
The force between two atoms depends not only on their chemical species and distance, but also on the configuration of their chemical bonds to other atoms. This strongly affects atomic force spectroscopy, in which the force between the tip of an atomic force microscope and a sample is measured as a function of distance. We show that the short-range forces between tip and sample atoms depend strongly on the configuration of the tip, to the point of preventing atom identification with a poorly defined tip. Our solution is to control the tip apex before using it for spectroscopy. We demonstrate a method by which a CO molecule on Cu can be used to characterize the tip. In combination with gentle pokes, this can be used to engineer a specific tip apex. This CO Front atom Identification (COFI) method allows us to use a well-defined tip to conduct force spectroscopy.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | SILICON (111)-(7X7) SURFACE; ELECTRONIC-STRUCTURE; MICROSCOPY; RECONSTRUCTION; DISCRIMINATION; SI(111)-(7X7); SI(111)7X7; RESOLUTION; ORDER; atomic force microscopy; chemical identification; atomic forces |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 03 Apr 2020 07:31 |
| Last Modified: | 03 Apr 2020 07:31 |
| URI: | https://pred.uni-regensburg.de/id/eprint/16270 |
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