Schachtner, Reinhard and Poeppel, Gerhard and Lang, Elmar W. (2010) A Nonnegative Blind Source Separation Model for Binary Test Data. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 57 (7). pp. 1439-1448. ISSN 1549-8328, 1558-0806
Full text not available from this repository.Abstract
A novel method called binNMF is introduced which aimed to extract hidden information from multivariate binary data sets. The method treats the problem in the spirit of blind source separation: The data are assumed to be generated by a superposition of several simultaneously acting sources or elementary causes which are not observable directly. The superposition process is based on a minimum of assumptions and reversed to identify the underlying sources. The method is motivated, developed, and demonstrated in the context of binary wafer test data which evolve during microchip fabrication.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | MATRIX FACTORIZATION; ALGORITHMS; Binary test data; binNMF; blind source separation (BSS); nonnegative matrix factorization (NMF) |
| Subjects: | 500 Science > 570 Life sciences |
| Divisions: | Biology, Preclinical Medicine > Institut für Biophysik und physikalische Biochemie > Prof. Dr. Elmar Lang |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 27 Jul 2020 10:30 |
| Last Modified: | 27 Jul 2020 10:30 |
| URI: | https://pred.uni-regensburg.de/id/eprint/24504 |
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