Seeholzer, T. and Gretz, O. and Giessibl, F. J. and Weymouth, A. J. (2019) A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data. NEW JOURNAL OF PHYSICS, 21: 083007. ISSN 1367-2630,
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One mode of atomic force microscopy (AFM) is frequency-modulation AFM, in which the tip is driven to oscillate at its resonance frequency which changes as the tip interacts with the surface. Frequency-modulation lateral force microscopy (FM-LFM) is the variant of this technique in which the tip is oscillated along the surface. For an isolated adsorbate on a flat surface, the only signal in FM-LFM is caused by the short-range interaction with the adsorbate. Various deconvolution methods exist to convert the observed frequency shift into the more physically relevant parameters of force and energy. While these methods are often used for FM-AFM data, the high number ofinflection points of FM-LFM data make standard deconvolution methods less reliable. In this article, we present a method based on Fourier decomposition of FM-LFM data and apply it to data taken of an isolated CO molecule on the Pt(111) surface. We probe the potential energy landscape past the potential energy minimum and show how over an adsorbate, the potential energy can be evaluated with a single FM-LFM image.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | ATOMIC-RESOLUTION; FRICTION; SHIFTS; TIP; atomic force microscopy; lateral force microscopy; Pt(111); frequency-modulation lateral force microscopy (FM-LFM); force deconvolution |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 01 Apr 2020 05:34 |
| Last Modified: | 01 Apr 2020 05:34 |
| URI: | https://pred.uni-regensburg.de/id/eprint/26457 |
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