Barrett, John W. and Garcke, Harald and Nuernberg, Robert (2007) A phase field model for the electromigration of intergranular voids. INTERFACES AND FREE BOUNDARIES, 9 (2). pp. 171-210. ISSN 1463-9971,
Full text not available from this repository. (Request a copy)Abstract
We propose a degenerate Allen-Cahn/Cahn-Hilliard system coupled to a quasi-static diffusion equation to model the motion of intergranular voids. The system can be viewed as a phase field system with an interfacial parameter gamma. In the limit gamma -> 0, the phase field system models the evolution of voids by surface diffusion and electromigration in an electrically conducting solid with a grain boundary. We introduce a finite element approximation for the proposed system, show stability bounds, prove convergence, and hence existence of a weak solution to this non-linear degenerate parabolic system in two space dimensions. An iterative scheme for solving the resulting non-linear discrete system at each time level is introduced and analysed, and some numerical experiments are presented. In the Appendix we discuss the sharp interface limit of the above degenerate system as the interfacial parameter gamma tends to zero.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | FINITE-ELEMENT APPROXIMATION; CAHN/CAHN-HILLIARD SYSTEM; SURFACE-DIFFUSION; BOUNDARY MOTION; THIN-FILM; EQUATIONS; EVOLUTION; MOBILITY; SCHEMES; SHARP; void electromigration; phase field model; degenerate Allen-Cahn/Cahn-Hilliard equation; fourth order degenerate parabolic equation; finite elements; convergence analysis; matched asymptotic expansions |
| Subjects: | 500 Science > 510 Mathematics |
| Divisions: | Mathematics > Prof. Dr. Harald Garcke |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 12 Jan 2021 09:35 |
| Last Modified: | 12 Jan 2021 09:35 |
| URI: | https://pred.uni-regensburg.de/id/eprint/33432 |
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