Giessibl, Franz J. and Quate, Calvin F. (2006) Exploring the nanoworld with atomic force microscopy. PHYSICS TODAY, 59 (12). pp. 44-50. ISSN 0031-9228,
Full text not available from this repository.| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | SILICON (111)-(7X7) SURFACE; RESOLUTION; DEFECTS; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 18 Jan 2021 10:45 |
| Last Modified: | 18 Jan 2021 10:45 |
| URI: | https://pred.uni-regensburg.de/id/eprint/33729 |
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