Giovanelli, L. and Panaccione, G. and Rossi, G. and Fabrizioli, M. and Tian, C. S. and Gastelois, P. L. and Fujii, J. and Back, Christian H. (2005) Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6). APPLIED PHYSICS LETTERS, 87 (4): 042506. ISSN 0003-6951,
Full text not available from this repository. (Request a copy)Abstract
We use Co atoms dispersed in a ferromagnetic Fe film as a magnetic marker material to probe the magnetic properties of the Fe film grown epitaxially on GaAs(001)-(4x6). X-ray magnetic circular dichroism on Co L-2,L-3 edges has been used to perform, in a Mossbauer-like experiment, a layer-dependent analysis. We find an enhancement of the Co orbital magnetic moment near the interface with the GaAs substrate, as well as a decrease of the spin magnetic moment when approaching the interface and at the surface of the Fe film. (c) 2005 American Institute of Physics.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | SUBSTRATE SURFACE RECONSTRUCTION; FE; GAAS(001); ANISOTROPY; DICHROISM; FILMS; SPECTROSCOPY; COBALT; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Christian Back |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 04 May 2021 07:07 |
| Last Modified: | 04 May 2021 07:07 |
| URI: | https://pred.uni-regensburg.de/id/eprint/35868 |
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