Vancura, T. and Kicin, S. and Ihn, T. and Ensslin, K. and Bichler, M. and Wegscheider, Werner (2003) Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK. APPLIED PHYSICS LETTERS, 83 (13). pp. 2602-2604. ISSN 0003-6951
Full text not available from this repository.Abstract
A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in a Ga[Al]As heterostructure. At different separations between atomic force microscope tip and sample, a dc voltage is applied between the tip and the electron gas while simultaneously recording the frequency shift of the oscillating tip. Using a plate capacitor model, the local electron density can be extracted from the data. The result coincides within 10% with the data obtained from transport measurements. (C) 2003 American Institute of Physics.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | ATOMIC-FORCE MICROSCOPY; QUARTZ TUNING FORK; RESOLUTION; DISTANCE; SENSOR; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 29 Jul 2021 09:43 |
| Last Modified: | 29 Jul 2021 09:43 |
| URI: | https://pred.uni-regensburg.de/id/eprint/38593 |
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