Saturation of photoresponse to intense THz radiation in AlGaN/GaN HEMT detector

Dyakonova, N. and Faltermeier, P. and But, D. B. and Coquillat, D. and Ganichev, S. D. and Knap, W. and Szkudlarek, K. and Cywinski, G. (2016) Saturation of photoresponse to intense THz radiation in AlGaN/GaN HEMT detector. JOURNAL OF APPLIED PHYSICS, 120 (16): 164507. ISSN 0021-8979, 1089-7550

Full text not available from this repository. (Request a copy)

Abstract

We report on the photoresponse of AlGaN/GaN high electron mobility transistors to the THz radiation of low (15 mW/cm(2)) and high (up to 40 kW/cm(2)) intensities. We show that the response can be described by the Dyakonov-Shur theory in the whole range of radiation intensity. At low intensities, the photoresponse is linear in radiation intensity. Under intense laser radiation, we observe a saturation at intensities >20 kW/cm(2). We explain our results by the change of the channel conductivity under the influence of strong THz field. This mechanism of photoresponse saturation, which is due to the mobility decrease in high ac electric field, should exist for any type of field effect transistor detectors. Published by AIP Publishing.

Item Type: Article
Uncontrolled Keywords: TUNNELING IONIZATION; TERAHERTZ; TRANSISTORS; TRANSPORT; FIELDS;
Subjects: 500 Science > 530 Physics
Divisions: Physics > Institute of Experimental and Applied Physics > Professor Ganichev > Group Sergey Ganichev
Depositing User: Dr. Gernot Deinzer
Date Deposited: 24 Apr 2019 11:01
Last Modified: 24 Apr 2019 11:02
URI: https://pred.uni-regensburg.de/id/eprint/4075

Actions (login required)

View Item View Item