Ooe, Hiroaki and Kirpal, Dominik and Wastl, Daniel S. and Weymouth, Alfred J. and Arai, Toyoko and Giessibl, Franz J. (2016) Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy. APPLIED PHYSICS LETTERS, 109 (14): 141603. ISSN 0003-6951, 1077-3118
Full text not available from this repository. (Request a copy)Abstract
In bimodal frequency modulation atomic force microscopy (FM-AFM), two flexural modes are excited simultaneously. We show atomically resolved images of KBr(100) in ambient conditions in both modes that display a strong correlation between the image quality and amplitude. We define the sum amplitude as the sum of the amplitudes of both modes. When the sum amplitude becomes larger than about 100 pm, the signal-to-noise ratio (SNR) drastically decreases. We propose that this is caused by the temporary presence of one or more water layers in the tip-sample gap. These water layers screen the short range interaction and must be displaced with each oscillation cycle. Decreasing the amplitude of either mode, however, increases the noise. Therefore, the highest SNR in ambient conditions is achieved when twice the sum amplitude is slightly less than the thickness of the primary hydration layer. Published by AIP Publishing.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | QUARTZ TUNING FORK; HYDRATION FORCES; RESOLUTION; SURFACES; WATER; AIR; CANTILEVERS; SENSOR; MODE; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 24 Apr 2019 10:58 |
| Last Modified: | 24 Apr 2019 10:58 |
| URI: | https://pred.uni-regensburg.de/id/eprint/4112 |
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