Fischer, Peter and Eimuller, T. and Schuetz, G. and Denbeaux, G. and Pearson, A. and Johnson, L. and Attwood, D. and Tsunashima, S. and Kumazawa, M. and Takagi, N. and Koehler, M. and Bayreuther, G. (2001) Element-specific imaging of magnetic domains at 25 nm spatial resolution using soft x-ray microscopy. REVIEW OF SCIENTIFIC INSTRUMENTS, 72 (5). pp. 2322-2324. ISSN 0034-6748
Full text not available from this repository. (Request a copy)Abstract
The combination of magnetic circular dichroism as a magnetic contrast mechanism and a transmission x-ray microscope allows imaging of magnetic structures with lateral resolutions down to 25 nm. Results on magneto-optical Tb-25(Fe75Co25)(75) layers system with thermomagnetically written bits of various sizes were obtained at the x-ray microscope XM-1 at the Advanced Light Source in Berkeley, CA. The results prove the thermal stability of the bits in the recording process. Furthermore the capability of soft x-ray microscopy with respect to the achievable lateral resolution, element specificity and sensitivity to thin magnetic layers is demonstrated. The potential of imaging in applied magnetic fields for both out-of-plane and in-plane magnetized thin magnetic films is outlined. (C) 2001 American Institute of Physics.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | TRANSMISSION ELECTRON-MICROSCOPY; CIRCULAR-DICHROISM; PROBE; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Günther Bayreuther |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 01 Feb 2022 08:18 |
| Last Modified: | 01 Feb 2022 08:18 |
| URI: | https://pred.uni-regensburg.de/id/eprint/41481 |
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