Brunner, W. and Attenberger, W. and Hoffmann, H. and Zweck, Josef (2001) Derivation of pair distribution functions for interface interdiffusion analysis for multilayered thin films using high-energy electron diffraction. JOURNAL OF PHYSICS-CONDENSED MATTER, 13 (13). pp. 2865-2873. ISSN 0953-8984
Full text not available from this repository.Abstract
High-energy electron diffraction has been used to obtain reduced density functions from multilayered thin films. Due to the very nature of the experiment, only interatomic correlations perpendicular to the incoming electron beam are responsible for the scattered intensity. This allows an investigation of the interface interdiffusion of inner surfaces. Since no specimen preparation is needed, the technique is uninfluenced by preparation artefacts. We describe the theory and the experimental requirements for the application of this method and present results obtained for a terbium/iron multilayer film.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | SCATTERING; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Josef Zweck |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 02 Feb 2022 13:24 |
| Last Modified: | 02 Feb 2022 13:24 |
| URI: | https://pred.uni-regensburg.de/id/eprint/41509 |
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