Oxygen diffusion in off-c-axis normal-state Bi2Sr2CaCu2O8+delta films

Gramm, A. and Zahner, T. and Spreitzer, U. and Rössler, R. and Pedarnig, J. D. and Bäuerle, D. and Lengfellner, Hans (2000) Oxygen diffusion in off-c-axis normal-state Bi2Sr2CaCu2O8+delta films. EUROPHYSICS LETTERS, 49 (4). pp. 501-506. ISSN 0295-5075

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Abstract

The anisotropy of the oxygen diffusion in the high-T-c-superconductor Bi2Sr2CaCu2O8+delta was investigated using off-c-axis prepared thin films. High-quality oriented films with thickness 1000 Angstrom and c-axis inclined by a tilt angle a with respect to the normal of the film surface were grown up to alpha = 15 degrees. Oxygen diffusion following a small change of the ambient oxygen partial pressure in the temperature range 200-400 degrees C was monitored by in situ resistance measurements. Diffusion times according to an activated process tau(-1) = tau(0)(-1) exp[-E/k(B)T] were found, with E = 0.6 eV and tau(0) = tau(0)(alpha) Becoming smaller with increasing tilt angle. A comparison of the experimental tau(0)(alpha) with a calculation of tau(0) for an ideal monocrystalline film suggests that as-grown films consist of crystalline grains with lateral dimensions similar to 1 mu m.

Item Type: Article
Uncontrolled Keywords: TRACER DIFFUSION; THIN-FILMS; RESISTIVITY; YBA2CU3O7-DELTA
Subjects: 500 Science > 530 Physics
Divisions: Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Hans Lengfellner
Depositing User: Dr. Gernot Deinzer
Date Deposited: 31 May 2022 09:05
Last Modified: 31 May 2022 09:05
URI: https://pred.uni-regensburg.de/id/eprint/42849

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