Puerckhauer, Korbinian and Maier, Simon and Merkel, Anja and Kirpal, Dominik and Giessibl, Franz J. (2020) Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions. REVIEW OF SCIENTIFIC INSTRUMENTS, 91 (8): 083701. ISSN 0034-6748, 1089-7623
Full text not available from this repository. (Request a copy)Abstract
Performing atomic force microscopy (AFM) and scanning tunneling microscopy (STM) with atomic resolution under ambient conditions is challenging due to enhanced noise and thermal drift. We show the design of a compact combined atomic force and scanning tunneling microscope that uses qPlus sensors and discuss the stability and thermal drift. By using a material with a low thermal expansion coefficient, we can perform constant height measurements and achieve atomic resolution in both AFM and STM on various samples. Moreover, the design allows a wide angle optical access to the sensor and the sample that is of interest for combining with optical microscopes or focusing optics with a high numerical aperture. Published under license by AlP Publishing.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | SPRING CONSTANTS; CALIBRATION; |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 17 Mar 2021 10:26 |
| Last Modified: | 17 Mar 2021 10:26 |
| URI: | https://pred.uni-regensburg.de/id/eprint/44104 |
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