Tunneling mechanism in a (Ga,Mn)As/GaAs-based spin Esaki diode investigated by bias-dependent shot noise measurements

Arakawa, T. and Shiogai, J. and Maeda, M. and Ciorga, M. and Utz, M. and Schuh, D. and Niimi, Y. and Kohda, M. and Nitta, J. and Bougeard, D. and Weiss, D. and Kobayashi, K. (2020) Tunneling mechanism in a (Ga,Mn)As/GaAs-based spin Esaki diode investigated by bias-dependent shot noise measurements. PHYSICAL REVIEW B, 102 (4): 045308. ISSN 2469-9950, 2469-9969

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Abstract

Electron transport across a tunneling barrier is governed by intricate and diverse causes such as interface conditions, material properties, and device geometries. Here, by measuring the shot noise, we investigate electron transport in a (Ga,Mn)As/GaAs-based spin Esaki diode junction over a wide range of bias voltage. The asymmetric electronic band profile across the junction allows us to tune the types of tunneling process. By changing the bias voltage in a single device, we successively address the conventional direct tunneling, the excess current conduction through the mid-gap localized states, and the thermal excitation current conduction. These observations lead to a proper comparison of the bias dependent Fano factors. While the Fano factor is unity for the direct tunneling, it is pronouncedly reduced in the excess current region. Thus, we have succeeded in evaluating several types of conduction process with the Fano factor in a single junction.

Item Type: Article
Uncontrolled Keywords: ELECTRICAL DETECTION; TRANSPORT; SUPPRESSION; UNIVERSALITY; PRECESSION;
Subjects: 500 Science > 530 Physics
Divisions: Physics > Institute of Experimental and Applied Physics
Physics > Institute of Experimental and Applied Physics > Chair Professor Huber > Group Dominique Bougeard
Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss
Depositing User: Dr. Gernot Deinzer
Date Deposited: 18 Mar 2021 07:57
Last Modified: 18 Mar 2021 07:57
URI: https://pred.uni-regensburg.de/id/eprint/44177

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