Liebig, A. and Peronio, A. and Meuer, D. and Weymouth, A. J. and Giessibl, F. J. (2020) High-precision atomic force microscopy with atomically-characterized tips. NEW JOURNAL OF PHYSICS, 22 (6): 063040. ISSN 1367-2630,
Full text not available from this repository. (Request a copy)Abstract
Traditionally, atomic force microscopy (AFM) experiments are conducted at tip-sample distances where the tip strongly interacts with the surface. This increases the signal-to-noise ratio, but poses the problem of relaxations in both tip and sample that hamper the theoretical description of experimental data. Here, we employ AFM at relatively large tip-sample distances where forces are only on the piconewton and subpiconewton scale to prevent tip and sample distortions. Acquiring data relatively far from the surface requires low noise measurements. We probed the CaF2(111) surface with an atomically-characterized metal tip and show that the experimental data can be reproduced with an electrostatic model. By experimentally characterizing the second layer of tip atoms, we were able to reproduce the data with 99.5% accuracy. Our work links the capabilities of non-invasive imaging at large tip-sample distances and controlling the tip apex at the atomic scale.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | RESOLUTION; SURFACE; CRYSTAL; atomic force microscopy; bulk insulators; electrostatic interaction; atomically-characterized tips |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 22 Mar 2021 12:11 |
| Last Modified: | 22 Mar 2021 12:11 |
| URI: | https://pred.uni-regensburg.de/id/eprint/44456 |
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