Penzkofer, Alfons and Drotleff, E. and Holzer, W. (1998) Optical constants measurement of single-layer thin films on transparent substrates. OPTICS COMMUNICATIONS, 158 (1-6). pp. 221-230. ISSN 0030-4018, 1873-0310
Full text not available from this repository.Abstract
A reflection and transmission technique is described, which allows the determination of the absorption coefficient spectrum, the refractive index dispersion, and the thickness of thin films on transparent substrates. The method may be used at any angle of incidence for s-polarized or p-polarized light. The absorption spectrum and the refractive index spectrum of a neat rhodamine 6G dye film on a fused silica substrate are determined. The absorption cross-section spectrum of the film is compared with the monomeric dye absorption cross-section spectrum in highly diluted solution. (C) 1998 Elsevier Science B.V. All rights reserved.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | REFRACTIVE-INDEXES; ELLIPSOMETRY; THICKNESS; MODEL |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Alfons Penzkofer |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 09 Feb 2023 06:58 |
| Last Modified: | 09 Feb 2023 06:58 |
| URI: | https://pred.uni-regensburg.de/id/eprint/49259 |
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