Anisotropic resistivity in off-c-axis grown Bi2Sr2CaCu2O8 films

Zahner, Thomas and Stierstorfer, R. and Rössler, R. and Pedarnig, J. D. and Bäuerle, D. and Lengfellner, Hans (1998) Anisotropic resistivity in off-c-axis grown Bi2Sr2CaCu2O8 films. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 298 (1-2). pp. 91-94. ISSN 0921-4534

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Abstract

Bi2Sr2CaCu2O8 thin films were prepared on off-c-axis (001) SrTiO3 substrates by pulsed-laser deposition. Oriented film growth, with a c-axis inclined with respect to the surface normal by a tilt angle alpha is found up to alpha similar or equal to 15 degrees from SEM, XRD and resistivity measurements. From a tensorial description of the film's resistivity, the in-plane and out-of-plane resistivities rho(ab) and rho(c) can be deduced. These measurements represent a new method to investigate anisotropic transport properties of materials, taking advantage of the availability of perfectly grown crystalline thin films instead of using bulk crystals. (C) 1998 Elsevier Science B.V.

Item Type: Article
Uncontrolled Keywords: SINGLE-CRYSTAL; Bi2Sr2CaCu2O8; off-axis growth; anisotropic resistivity
Subjects: 500 Science > 530 Physics
Divisions: Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Hans Lengfellner
Depositing User: Dr. Gernot Deinzer
Date Deposited: 28 Feb 2023 07:16
Last Modified: 28 Feb 2023 07:16
URI: https://pred.uni-regensburg.de/id/eprint/50016

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