Albrecht, F. and Repp, J. and Fleischmann, M. and Scheer, M. and Ondracek, M. and Jelinek, P. (2015) Probing Charges on the Atomic Scale by Means of Atomic Microscopy. PHYSICAL REVIEW LETTERS, 115 (7): 076101. ISSN 0031-9007, 1079-7114
Full text not available from this repository. (Request a copy)Abstract
Kelvin probe force spectroscopy was used to characterize the charge distribution of individual molecules with polar bonds. Whereas this technique represents the charge distribution with moderate resolution for large tip-molecule separations, it fails for short distances. Here, we introduce a novel local force spectroscopy technique which allows one to better disentangle electrostatic from other contributions in the force signal. It enables one to obtain charge-related maps at even closer tip-sample distances, where the lateral resolution is further enhanced. This enhanced resolution allows one to resolve contrast variations along individual polar bonds.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | DYNAMIC FORCE MICROSCOPY; SINGLE-MOLECULE; RESOLUTION; |
| Subjects: | 500 Science > 530 Physics 500 Science > 540 Chemistry & allied sciences |
| Divisions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Jascha Repp Chemistry and Pharmacy > Institut für Anorganische Chemie |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 14 Jun 2019 11:15 |
| Last Modified: | 14 Jun 2019 11:15 |
| URI: | https://pred.uni-regensburg.de/id/eprint/5023 |
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