Chladek, M. and Valvoda, V. and Dorner, C. and Ernst, W. (1997) Quantitative comparison of structural parameters of magnetic multilayers obtained by diffraction methods and by direct imaging techniques .1. Interlayer structure. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 172 (3). pp. 209-217. ISSN 0304-8853, 1873-4766
Full text not available from this repository.Abstract
The interlayer structure of a magnetic multilayer [Ni30Co70(5.6 Angstrom)/Au(15 Angstrom)](16) has been analyzed by low-angle X-ray diffraction (LXRD), transmission electron microscopy (TEM) and by scanning tunneling microscopy (STM). The values of total thickness, sublayer thickness, multilayer periodicity length, interface roughness and in-plane correlation length obtained by LXRD agree very well with the values received from a detail analysis of TEM micrographs and STM scans. The presented results confirm reliability of XRD structural parameters as derived from specular reflectivity, area scans and Omega scan data measurements, The comparison has been found very helpful in evaluation of a real physical meaning of these interlayer structural parameters.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | X-RAY REFLECTION; SCATTERING; ROUGHNESS; magnetic multilayers; multilayer structure; X-ray diffraction; XRD; diffuse scattering; distorted wave born approximation; DWBA; electron microscopy; scanning tunneling microscopy; STM |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 25 Apr 2023 06:00 |
| Last Modified: | 25 Apr 2023 06:00 |
| URI: | https://pred.uni-regensburg.de/id/eprint/50673 |
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