Quantitative comparison of structural parameters of magnetic multilayers obtained by diffraction methods and by direct imaging techniques .2. Intralayer structure

Chladek, M. and Valvoda, V. and Dorner, C. (1997) Quantitative comparison of structural parameters of magnetic multilayers obtained by diffraction methods and by direct imaging techniques .2. Intralayer structure. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 172 (3). pp. 218-224. ISSN 0304-8853, 1873-4766

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Abstract

The intralayer structure of a magnetic multilayer [Ni30Co70(5.6 Angstrom)/Au(15 Angstrom)](16) has been analyzed by high-angle X-ray diffraction (HXRD), transmission electron diffraction (TED) and by high-resolution electron microscopy (HREM). The following structure parameters were determined: multilayer periodicity length, thickness of sublayers, interface roughness on smaller scales, average lattice spacing, lattice spacing of components and degree of preferred orientation. It was found that the adherent multilayer is under a compressive stress. In cases where a comparison was possible, TED measurements confirmed well the results derived from HXRD. The accuracy of HXRD measurements in comparison with TED has been found higher. We have shown that non-destructive HXRD studies of multilayer structures can easily give reliable and physically realistic results. The method is relatively fast, supplies quantitative data about internal structure of sublayers, about microstructure of the sample and characterizes the multilayer structure averaged over the whole volume. We have presented that the combination of low-and high-angle XRD is very powerful approach for its ability to get structure information measured on different scales. This advantage, together with application of direct imaging techniques, enabled us to give a very detailed description and interpretation of interface morphology parameters which belong to the most important parameters in metallic magnetic multilayers.

Item Type: Article
Uncontrolled Keywords: X-RAY-DIFFRACTION; magnetic multilayers; multilayer structure; X-ray diffraction; XRD; electron diffraction; TED; HREM
Subjects: 500 Science > 530 Physics
Divisions: Physics > Institute of Experimental and Applied Physics
Depositing User: Dr. Gernot Deinzer
Date Deposited: 25 Apr 2023 06:02
Last Modified: 25 Apr 2023 06:02
URI: https://pred.uni-regensburg.de/id/eprint/50674

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