Chladek, M. and Dorner, C. and Buchal, A. and Valvoda, V. and Hoffmann, H. (1996) Quantitative in situ x-ray diffraction analysis of magnetic multilayers during annealing. JOURNAL OF APPLIED PHYSICS, 80 (3). pp. 1437-1445. ISSN 0021-8979, 1089-7550
Full text not available from this repository.Abstract
In situ high-angle x-ray diffraction (XRD) measurements during an annealing process and extensive low- and high-angle XRD analysis before and after annealing have been performed to study the influence of annealing on the microstructure of a Ni81Fe19/Ag multilayer film. We concentrate on a detailed description and quantification of induced changes in microstructural properties and on changes in the crystalline structure of sublayers. The observed effects obtained from the high-angle XRD, where superlattice structural refinement and standard powder diffraction methods were used, are utilized to model the changes from microscopic point of view. The low-angle XRD reflectivity measurements were analyzed using a new distorted-wave Born approximation approach which enables to get information about interlayer structure parameters such as interface roughnesses, degree of vertical correlation and lateral correlation length. The presented low-angle and high-angle analysis demonstrates general applicability of x-ray diffraction for complex and quantitative in-situ investigation of structural changes in metallic multilayers during annealing. An effect of lateral scaling for different types of roughness is discussed and a general approach is shown for the case of metallic multilayers. (C) 1996 American Institute of Physics.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | GIANT MAGNETORESISTANCE; THIN-FILMS; LOW FIELDS; REFLECTION; SCATTERING; ROUGHNESS; EXCHANGE; SURFACES; SYSTEMS; TEM |
| Subjects: | 500 Science > 530 Physics |
| Divisions: | Physics > Institute of Experimental and Applied Physics |
| Depositing User: | Dr. Gernot Deinzer |
| Date Deposited: | 29 Jun 2023 09:00 |
| Last Modified: | 29 Jun 2023 09:00 |
| URI: | https://pred.uni-regensburg.de/id/eprint/51570 |
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