STRAIN SPLITTING OF NITROGEN ACCEPTOR LEVELS IN ZNSE

MAYER, H and ROSSLER, U and WOLF, K and ELSTNER, A and STANZL, H and REISINGER, T and GEBHARDT, W (1995) STRAIN SPLITTING OF NITROGEN ACCEPTOR LEVELS IN ZNSE. PHYSICAL REVIEW B, 52 (7). pp. 4956-4964. ISSN 0163-1829,

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Abstract

We report on the experimental and theoretical study of the strain splitting of nitrogen acceptor levels in epitaxially grown ZnSe on GaAs substrate, The crystal strain is due to the different lattice constants and thermal expansion coefficients and is determined by x-ray diffractometry. The binding energies of the acceptor ground and excited states have been determined by temperature-dependent and resonant photoluminescence measurements involving two-hob transitions for three differently strained layers. A consistent theoretical description of the experimental data is given in terms of the model of Baldereschi and Lipari, augmented by the Bir-Pikus Hamiltonian to account for the strain splitting of the valence-band edge. An empirical ansatz for the central-cell correction is used in order to reproduce the chemical shift of the nitrogen acceptor.

Item Type: Article
Uncontrolled Keywords: SPHERICAL MODEL; LASER-DIODES; STATES; ZNTE; GROWTH;
Depositing User: Dr. Gernot Deinzer
Last Modified: 19 Oct 2022 08:37
URI: https://pred.uni-regensburg.de/id/eprint/52384

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