BOCHNICEK, Z and HOLY, V and WOLF, K and STANZL, H and GEBHARDT, W
(1995)
HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY OF ZNTE LAYERS AT ELEVATED-TEMPERATURES.
JOURNAL OF APPLIED PHYSICS, 78 (2).
pp. 862-867.
ISSN 0021-8979,
Full text not available from this repository.
| Item Type: |
Article
|
| Uncontrolled Keywords: |
THERMAL-EXPANSION; EPITAXIAL LAYERS; DIFFRACTION; PARAMETERS; CRYSTALS; GAAS; |
| Depositing User: |
Dr. Gernot Deinzer
|
| Last Modified: |
19 Oct 2022 08:37 |
| URI: |
https://pred.uni-regensburg.de/id/eprint/52429 |
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