Characterization of a Surface Reaction by Means of Atomic Force Microscopy

Albrecht, Florian and Pavlicek, Niko and Herranz-Lancho, Coral and Ruben, Mario and Repp, Jascha (2015) Characterization of a Surface Reaction by Means of Atomic Force Microscopy. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 137 (23). pp. 7424-7428. ISSN 0002-7863,

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Abstract

We study a thermally activated on-surface planarization reaction by a detailed analysis of the reactant and reaction products from atomically resolved atomic forte microscopy (AFM), images and spectroscopy. The three-dimensional (3D) structure of the reactant, a helical diphenanthrene derivative, requires going beyond constant-height imaging. The characterization in three dimensions is enabled by acquisition and analysis of the AFM signal in a 3D data set. This Way, the structure and geometry of nonplanar molecules as well as their reaction products on terraces and at step edges can be determined.

Item Type: Article
Uncontrolled Keywords: CHEMICAL-STRUCTURE; RESOLUTION; MOLECULES; STEPS;
Subjects: 500 Science > 530 Physics
Divisions: Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Jascha Repp
Depositing User: Dr. Gernot Deinzer
Date Deposited: 10 Jul 2019 13:54
Last Modified: 10 Jul 2019 13:54
URI: https://pred.uni-regensburg.de/id/eprint/5311

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