CHAOTIC FLUCTUATIONS AND FORMATION OF A CURRENT FILAMENT IN N-TYPE GAAS

BRANDL, A and PRETTL, W (1991) CHAOTIC FLUCTUATIONS AND FORMATION OF A CURRENT FILAMENT IN N-TYPE GAAS. PHYSICAL REVIEW LETTERS, 66 (23). pp. 3044-3047. ISSN 0031-9007, 1079-7114

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Abstract

A novel nonlinear model is presented for the occurrence of current fluctuations at low temperatures in extrinsic semiconductors. It is based on impact ionization of shallow impurities and structure-forming processes leading to a current filament. Numerical investigations reproduce the current-voltage characteristics and reveal regular, quasiperiodic, and frequency-locked spontaneous current oscillations and a Ruelle-Takens-Newhouse transition to chaos in agreement with experimental observations in n-type GaAs.

Item Type: Article
Uncontrolled Keywords: IMPACT IONIZATION; OSCILLATIONS; GE; SEMICONDUCTORS; TRANSITION; BREAKDOWN;
Depositing User: Dr. Gernot Deinzer
Last Modified: 19 Oct 2022 08:46
URI: https://pred.uni-regensburg.de/id/eprint/54981

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