DIFFUSION BARRIER PROPERTIES OF TI/TIN INVESTIGATED BY TRANSMISSION ELECTRON-MICROSCOPY

MANDL, M and HOFFMANN, H and KUCHER, P (1990) DIFFUSION BARRIER PROPERTIES OF TI/TIN INVESTIGATED BY TRANSMISSION ELECTRON-MICROSCOPY. JOURNAL OF APPLIED PHYSICS, 68 (5). pp. 2127-2132. ISSN 0021-8979,

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Item Type: Article
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Depositing User: Dr. Gernot Deinzer
Last Modified: 19 Oct 2022 08:48
URI: https://pred.uni-regensburg.de/id/eprint/55301

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