RELIABILITY OF MOCVD GROWN ALGAAS GAAS-LASER DIODES AT -20-C HEATSINK TEMPERATURE

BEGLEY, DL and DREISEWERD, D and FRITZ, W and SCHWEDT, S and ELLIOTT, G and LANGILL, T and LUFT, J and WUDY, E (1990) RELIABILITY OF MOCVD GROWN ALGAAS GAAS-LASER DIODES AT -20-C HEATSINK TEMPERATURE. IEEE PHOTONICS TECHNOLOGY LETTERS, 2 (5). pp. 316-318. ISSN 1041-1135,

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: ;
Depositing User: Dr. Gernot Deinzer
Last Modified: 19 Oct 2022 08:48
URI: https://pred.uni-regensburg.de/id/eprint/55421

Actions (login required)

View Item View Item