Items where Author is "Albrecht, F."
 | Up a level |
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 2.
Article
Albrecht, F. and Repp, J. and Fleischmann, M. and Scheer, M. and Ondracek, M. and Jelinek, P. (2015) Probing Charges on the Atomic Scale by Means of Atomic Microscopy. PHYSICAL REVIEW LETTERS, 115 (7): 076101. ISSN 0031-9007, 1079-7114
Muennich, G. and Albrecht, F. and Nacci, C. and Utz, M. and Schuh, D. and Kanisawa, K. and Foelsch, S. and Repp, J. (2012) Probing individual weakly-coupled pi-conjugated molecules on semiconductor surfaces. JOURNAL OF APPLIED PHYSICS, 112 (3): 034312. ISSN 0021-8979, 1089-7550
