Items where Division is "Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl" and Year is 2010

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H

Hofmann, Thomas and Welker, J. and Giessibl, F. J. (2010) Preparation of light-atom tips for scanning probe microscopy by explosive delamination. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 28 (3). ISSN 1071-1023

T

Tung, Ryan C. and Wutscher, Thorsten and Martinez-Martin, David and Reifenberger, Ronald G. and Giessibl, Franz and Raman, Arvind (2010) Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy. JOURNAL OF APPLIED PHYSICS, 107 (10): 104508. ISSN 0021-8979

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