Items where Division is "Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl" and Year is 2011

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Giessibl, Franz J. and Pielmeier, Florian and Eguchi, Toyoaki and An, Toshu and Hasegawa, Yukio (2011) Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. PHYSICAL REVIEW B, 84 (12): 125409. ISSN 1098-0121

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Ternes, Markus and Gonzalez, Cesar and Lutz, Christopher P. and Hapala, Prokop and Giessibl, Franz J. and Jelinek, Pavel and Heinrich, Andreas J. (2011) Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts. PHYSICAL REVIEW LETTERS, 106 (1): 016802. ISSN 0031-9007, 1079-7114

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Welker, Joachim and Elsner, Frederico de Faria and Giessibl, Franz J. (2011) Application of the equipartition theorem to the thermal excitation of quartz tuning forks. APPLIED PHYSICS LETTERS, 99 (8): 084102. ISSN 0003-6951

Weymouth, A. J. and Wutscher, T. and Welker, J. and Hofmann, T. and Giessibl, F. J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). PHYSICAL REVIEW LETTERS, 106 (22): 226801. ISSN 0031-9007

Wutscher, Elisabeth and Giessibl, Franz J. (2011) Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes. REVIEW OF SCIENTIFIC INSTRUMENTS, 82 (9): 093703. ISSN 0034-6748

Wutscher, T. and Giessibl, F. J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. REVIEW OF SCIENTIFIC INSTRUMENTS, 82 (2): 026106. ISSN 0034-6748